We perform structural (crystalline and morphological) and chemical analyses
required to qualify and validate the new materials and the elaboration
techniques developped in our laboratory. Resources used are, in particular,
X-ray diffraction, transmission electron microscopy, microanalysis and atomic
force microscopy. These activities are carried out into the Materials ANAlysis Plateform (PANAM), which is part of
Department of Materials
Several types of diffraction and reflectometry analysis are proposed at LPN with state-of-the-art X-Ray diffractometers. Crystalline structures, defaults, alloy composition, relatives crystalline orientations can be precisely studied in a non-destructive way for thin films and for assemblies of nanowires or quantum dots.
Auto-aligned multi-configurations diffractometer equipped with a 9kW rotating anode for powder diffraction, pole figures, reflectometry, high resolution diffraction, and grazing incidence diffraction (in-plane diffraction of crystallographic planes perpendicular to the surface.
Material characterization is required for producing optimally grown functional nanostructures. Transmission Electron Microscopy is a very powerful tool for investigating nanostructures at the atomic scale.
A transmission electron microscope corrected from spherical aberrations allows focusing a very intense electron current as high as 55pA in a beam of 1 Angstrom diameter, which is the size of a unique atomic column. Scattering electrons are collected for the image formation, while X rays produced when the electron beam impacts the structure are collected for a chemical cartography or a spectroscopic investigation of the composition at the atomic scale.
LPN has purchased a Jeol 2200FS Transmission Electron Microscope, equiped with a corrector of spherical aberrations on the STEM probe, and also with an "ultra-high resolution" objective lens. This combination of a TEM column with these analysis tools operating since end of 2008.
STEM image in high resolution annular dark field (HAADF) of a InAsP
quantum wire. Each white dot corresponds to an atomic column.
These wires are grown by Vapor Liquid Solid -VLS- technique in an MBE equipment (J.C. Harmand)
C2N hosts and coordinates NANOTEM platform
which consists of a TEM / STEM FEI Titan Themis (200kV, XFEG, Cs-corrector probe) with a EDX detector SuperX and a dual-beam
(focused ion and electron) FEI Scios.
TEM/STEM Titan Themis 200
- XFEG 80-200 keV
- Chemistem Super-X (EDX)
- Probe Cs-corrector (res : 80 pm)
- STEM BF, ABF, HAADF
- S-Twin polar piece 5,4 mm
(res point : 240 pm)
- camera CMOS CETA 4kx4k
- plasma cleaner
- cryo-plunger (hosted by LPS)
- NiCol UHR Non immersion FESEM
- Sidewinder Ion Column 500V-30kV
- In-lens detector
- ETD/ICE detectors
- In-situ Easy-Lift manipulator
- Pt/ C GIS
C2N is also an actor of NANOMAX project dedicated to the study of nanocrystal growth in real time with atomic resolution in an environmental microscope (FEI Titan ETEM 300kV installed at Ecole Polytechnique).
The Atomic Force Microscope and related applications is today an indispensable tool to characterize surfaces at nanometer/atomic scale.
The use of the complementarity of these AFM equipments in association with other surface characterization techniques, such as Scanning Electron Microscope,
allows the development of efficient technological processes. Basic analyzes of surface characteristics (topography, roughness, film thickness) with monoatomic resolution,
or studies using the magnetic or electric modes are used. AFM can also been used as a Nano-tool to modify surface of a sample by local anodic oxydation (LAO).
The three AFM are managed by a specific team (3 permanent peoples), which respond to requests and form the users. Two of the three AFM are located in the clean room.
One is used in restricted access and attached to the technology center, while the two other are devoted to specific studies in Departments of
Under atmosphere controlled
Tél : 01 69 63 61 82
Tél : 01 69 63 61 75
Operating modes : Contact and tapping
Observation modes : topography, MFM, EFM/KFM, LAO
Z resolution : 0.05nm
Scanning field : 90 * 90 µm
Sample size : until 150 mm
Equipped for nanomanipulations of nano devices
Tél : 01 69 63 61 82
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