Laboratory for Photonics and Nanostructures
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Semiconductor and Nanostructures Processing and Analysis > Structural Analyses
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Puce Objectifs

We perform structural (crystalline and morphological) and chemical analyses required to qualify and validate the new materials and the elaboration techniques developped in our laboratory. Resources used are, in particular, X-ray diffraction, transmission electron microscopy, microanalysis and atomic force microscopy. These activities are carried out into the Elaboration and Physics of Epitaxial Structures (ELPHYSE) group.


Puce Moyens

Puce X-Ray diffraction

Several types of diffraction and reflectometry analysis are proposed at LPN with state-of-the-art X-Ray diffractometers. Crystalline structures, defaults, alloy composition, relatives crystalline orientations can be precisely studied in a non-destructive way for thin films and for assemblies of nanowires or quantum dots.

Puce Multi-configurations diffractometer with rotating anode « Smartlab » RIGAKU

rigaku1 rigaku2
Specifications:

Auto-aligned multi-configurations diffractometer equipped with a 9kW rotating anode for powder diffraction, pole figures, reflectometry, high resolution diffraction, and grazing incidence diffraction (in-plane diffraction of crystallographic planes perpendicular to the surface.

  • 9kW rotating anode source
  • focusing mirror
  • incident beam monochromator Ge(400)x2 and diffracted beam monochromator Ge(220)x2
  • polycapillary lens
  • incident beam collimators 0,15°, 0,5°, 5°
  • diffracted beam collimators 0,114°, 0,5°, 5°
  • scintillation detector

Puce Multi-configurations diffractometer with sealed tube « X'Pert Pro MRD » PANalytical

ANSTFig1
Specifications:
  • focusing mirror
  • incident beam monochromator Bartels Ge(220)x4 and diffracted beam monochromator Ge(220)x3
  • polycapillary lens
  • collimator 0,18°
  • 1D Pixcel detector
  • Xe detectors


Phone numbers : 0033-(0)1-69-63-63-32 & 0033-(0)1-69-63-62-02

Persons in charge of these equipments : L. Largeau, O. Mauguin


Puce Aberration-corrected Transmission Electron Microscopy

Material characterization is required for producing optimally grown functional nanostructures. Transmission Electron Microscopy is a very powerful tool for investigating nanostructures at the atomic scale.

A transmission electron microscope corrected from spherical aberrations allows focusing a very intense electron current as high as 55pA in a beam of 1 Angstrom diameter, which is the size of a unique atomic column. Scattering electrons are collected for the image formation, while X rays produced when the electron beam impacts the structure are collected for a chemical cartography or a spectroscopic investigation of the composition at the atomic scale.

LPN has purchased a Jeol 2200FS Transmission Electron Microscope, equiped with a corrector of spherical aberrations on the STEM probe, and also with an "ultra-high resolution" objective lens. This combination of a TEM column with these analysis tools operating since end of 2008.

STEM image in high resolution annular dark field (HAADF) of a InAsP quantum wire. Each white dot corresponds to an atomic column.
These wires are grown by Vapor Liquid Solid -VLS- technique in an MBE equipment (J.C. Harmand)


Phone numbers : 0033-(0)1-69-63-63-98 & 0033-(0)1-69-63-62-04

Persons in charge of these equipments : G. Patriarche, L. Largeau


Puce Actions

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Last update :
05/07/2012

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